Atomic force microscopy of Bacillus spore surface morphology
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چکیده
منابع مشابه
Atomic force microscopy of Bacillus spore surface morphology.
Bacillus spore surface morphology was imaged with atomic force microscopy (AFM) to determine if characteristic surface features could be used to distinguish between four closely related species; Bacillus anthracis Sterne strain, Bacillus thuringiensis var. kurstaki, Bacillus cereus strain 569, and Bacillus globigii var. niger. AFM surface height images showed an irregular topography across the ...
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ژورنال
عنوان ژورنال: Micron
سال: 2006
ISSN: 0968-4328
DOI: 10.1016/j.micron.2005.11.006